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Investigation of slice thickness and shape milled by a focused ion beam for three-dimensional reconstruction of microstructures
Journal article

Investigation of slice thickness and shape milled by a focused ion beam for three-dimensional reconstruction of microstructures

HG Jones, KP Mingard and DC Cox
ULTRAMICROSCOPY, Vol.139, pp.20-28
01/04/2014

Abstract

Science & Technology Technology Microscopy MICROSCOPY Focused ion beam 3D reconstruction Slice geometry Microstructure FIB-SEM SPECIMEN PREPARATION TOMOGRAPHY
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