Abstract
The 12th International Conference on Proton Induced X-ray Emission (PIXE) and its Analytical Applications was held on the campus of the University of Surrey in Guildford, U.K. between 29 th June and 2nd July 2010. The PIXE conferences have been held at approximately three year intervals since the mid 1970s and have reflected the development of the PIXE technique and its expanding range of applications. This special issue of X-Ray Spectrometry contains papers based on conference contributions which have been selected to represent the latest developments in PIXE and its applications.