Characterization of as implanted silicides by frequency noise level measurements

M Stojanovic; M Milosavljevic; C Jeynes

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Characterization of as implanted silicides by frequency noise level measurements

Conference presentation

Peer reviewed

Characterization of as implanted silicides by frequency noise level measurements

M Stojanovic, M Milosavljevic and C Jeynes

ADVANCED MATERIALS AND PROCESSES, Vol.282-2, pp.153-156

2nd Yugoslav Conference on Advanced Materials (YUGOMAT II) (HERCEG-NOVI, YUGOSLAVIA, 15/09/1997 - 19/09/1997)

01/01/1998

Abstract

Science & Technology

Technology

Physical Sciences

Materials Science

Ceramics

Materials Science

Multidisciplinary

Metallurgy & Metallurgical Engineering

Materials Science

Coatings & Films

Materials Science

Composites

Polymer Science

Materials Science

ion beam

implantation

surface

silicide

RBS

noise level characterization

CONTACTS

SILICON

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Title: Characterization of as implanted silicides by frequency noise level measurements
Creators: M Stojanovic
M Milosavljevic
C Jeynes
Contributors: DP Uskokovic
SK Milonjic
DI Rakovic
TRANSTEC PUBLICATIONS LTD (Publisher)
Publication Details: ADVANCED MATERIALS AND PROCESSES, Vol.282-2, pp.153-156
Conference: 2nd Yugoslav Conference on Advanced Materials (YUGOMAT II) (HERCEG-NOVI, YUGOSLAVIA, 15/09/1997 - 19/09/1997)
Date published: 01/01/1998
Date submitted: 17/05/2017
Identifiers: 99512666602346
Academic Unit: University of Surrey
Resource Type: Conference presentation

Characterization of as implanted silicides by frequency noise level measurements

Abstract

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