Surface characterization of aspirin crystal planes by dynamic chemical force microscopy

A Danesh; MC Davies; SJ Hinder; CJ Roberts; SJB Tendler; PM Williams; MJ Wilkins

doi:10.1021/ac991498u

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Surface characterization of aspirin crystal planes by dynamic chemical force microscopy

Journal article

Peer reviewed

Surface characterization of aspirin crystal planes by dynamic chemical force microscopy

A Danesh, MC Davies, SJ Hinder, CJ Roberts, SJB Tendler, PM Williams and MJ Wilkins

ANALYTICAL CHEMISTRY, Vol.72(15), pp.3419-3422

01/08/2000

DOI: https://doi.org/10.1021/ac991498u

Abstract

Science & Technology

Physical Sciences

Chemistry

Analytical

Chemistry

CHEMISTRY

ANALYTICAL

SELF-ASSEMBLED MONOLAYERS

TAPPING-MODE

ADHESION

FRICTION

GOLD

HABITS

ACID

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Title: Surface characterization of aspirin crystal planes by dynamic chemical force microscopy
Creators: A Danesh
MC Davies
SJ Hinder
CJ Roberts
SJB Tendler
PM Williams
MJ Wilkins
Publication Details: ANALYTICAL CHEMISTRY, Vol.72(15), pp.3419-3422
Publisher: AMER CHEMICAL SOC
Date published: 01/08/2000
Date submitted: 17/05/2017
Identifiers: 99512640502346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Surface characterization of aspirin crystal planes by dynamic chemical force microscopy

Abstract

Files and links (1)

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Details

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