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A study of the surface chemistry, morphology and wear of silicon based MEMS
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A study of the surface chemistry, morphology and wear of silicon based MEMS

J Li, Z Cui and MA Baker
SURFACE AND INTERFACE ANALYSIS, Vol.36(8), pp.1254-1258
10th European Conference on Applications of Surface and Interface Analysis (ECASIA 03) (Berlin, GERMANY, 05/10/2003 - 10/10/2003)
01/08/2004

Abstract

Science & Technology Physical Sciences Chemistry Physical Chemistry CHEMISTRY PHYSICAL microelectromechanical systems XPS atomic force microscopy wear ATOMIC-FORCE MICROSCOPY NANOTRIBOLOGICAL PROPERTIES MONOLAYER FILMS IV SI
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