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Deactivation of ultra shallow B and BF2 profiles after non-melt laser annealing
Conference presentation   Peer reviewed

Deactivation of ultra shallow B and BF2 profiles after non-melt laser annealing

JA Sharp, NEB Cowern, RP Webb, D Giubertoni, S Gennaro, M Bersani, MA Foad and KJ Kirkby
Doping Engineering for Device Fabrication, Vol.912, pp.159-163
Symposium on Sub Second Rapid Thermal Processing for Device Fabrication held at the 2006 MRS Spring Meeting (San Francisco, CA, 18/04/2006 - 19/04/2006)
01/01/2006

Abstract

Science & Technology Technology Materials Science Multidisciplinary Materials Science Characterization & Testing Materials Science JUNCTIONS ACTIVATION DIFFUSION BORON
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