Abstract
In this work, the feasibility of XPS analysis using locally generated Al K α radiation has been demonstrated. Both photo and Auger-electron signals can be obtained from a single, sub-micrometre, particle, achieving the aim of chemical state identi fi cation by means of the Auger parameter. The results, demonstrated in t his work using copper particles on an aluminium substrate, suggest that the technique, with further development, will be valuable for those concerned with the health hazards of nano-particles in general.