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Characterization of thick film poly(triarylamine) semiconductor diodes for direct x-ray detection
Journal article   Open access  Peer reviewed

Characterization of thick film poly(triarylamine) semiconductor diodes for direct x-ray detection

A Intaniwet, CA Mills, M Shkunov, H Thiem, JL Keddie and PJ Sellin
JOURNAL OF APPLIED PHYSICS, Vol.106(6), pp.?-?
15/09/2009
DOI: https://doi.org/10.1063/1.3225909

Abstract

Science & Technology Physical Sciences Physics Applied Physics PHYSICS APPLIED FIELD-EFFECT TRANSISTORS CHARGE-LIMITED CURRENTS LIGHT-EMITTING-DIODES SPACE-CHARGE POLYMER PHOTOCURRENT ELECTRONICS INSULATORS DEVICES TRAPS
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