Fabric defect detection by Fourier analysis

Conference presentation

Fabric defect detection by Fourier analysis

C-H Chan and G Pang

Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE, Vol.3

1999

Abstract

Metrics

34 Record Views

Details

Title: Fabric defect detection by Fourier analysis
Creators: C-H Chan
G Pang
Publication Details: Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE, Vol.3
Date published: 1999
Date submitted: 17/05/2017
Identifiers: 99511660402346
Academic Unit: University of Surrey
Resource Type: Conference presentation