CHARACTERISTICS OF RARE-EARTH ELEMENT ERBIUM IMPLANTED IN SILICON

YS TANG; KC HEASMAN; WP GILLIN; BJ SEALY

doi:10.1063/1.101888

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CHARACTERISTICS OF RARE-EARTH ELEMENT ERBIUM IMPLANTED IN SILICON

Journal article

Peer reviewed

CHARACTERISTICS OF RARE-EARTH ELEMENT ERBIUM IMPLANTED IN SILICON

YS TANG, KC HEASMAN, WP GILLIN and BJ SEALY

APPLIED PHYSICS LETTERS, Vol.55(5), pp.432-433

31/07/1989

DOI: https://doi.org/10.1063/1.101888

Abstract

Science & Technology

Physical Sciences

Physics

Applied

Physics

PHYSICS

APPLIED

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Title: CHARACTERISTICS OF RARE-EARTH ELEMENT ERBIUM IMPLANTED IN SILICON
Creators: YS TANG
KC HEASMAN
WP GILLIN
BJ SEALY
Publication Details: APPLIED PHYSICS LETTERS, Vol.55(5), pp.432-433
Publisher: AMER INST PHYSICS
Date published: 31/07/1989
Date submitted: 17/05/2017
Identifiers: 99511301602346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

CHARACTERISTICS OF RARE-EARTH ELEMENT ERBIUM IMPLANTED IN SILICON

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