Surrey researchers Sign in
Characterization and enviromental impact of plasma products within an ion implanter
Conference presentation   Open access

Characterization and enviromental impact of plasma products within an ion implanter

H Zurrug, J Mefo, B Sealy, G Boudreault, C Jeynes, RP Webb, KJ Kirkby, EJH Collart, B Brown, TL Alford, …
IIT2002: ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, pp.471-474
14th International Conference on Ion Implantation Technology (TAOS, NM, 18/09/2002 - 27/09/2002)
01/01/2003

Abstract

Science & Technology Technology Physical Sciences Engineering Manufacturing Engineering Electrical & Electronic Physics Applied Physics Condensed Matter Engineering Physics ion implantation plasma products implant residues plasma-dopant interactions Rutherford Backscattering (RBS) Sb implantation B implantation silicon
pdf
fulltext1.70 MBDownloadView
Text Open Access
url
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000189388900119&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=11d2a86992e85fb529977dad66a846d5View
Author

Metrics

155 File views/ downloads
36 Record Views

Details

Usage Policy