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Anomalous diffusion of ultra low energy boron implants in silicon
Journal article   Peer reviewed

Anomalous diffusion of ultra low energy boron implants in silicon

RP Webb, MA Foad, RM Gwilliam, AP Knights and G Thomas
DEFECTS AND DIFFUSION IN SILICON PROCESSING, Vol.469, pp.59-63
01/01/1997

Abstract

Science & Technology Technology Materials Science Multidisciplinary Materials Science
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