Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study

MJ Bailey; KJ Kirkby; C Jeynes

doi:10.1002/xrs.1142

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Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study

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Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study

MJ Bailey, KJ Kirkby and C Jeynes

X-RAY SPECTROMETRY, Vol.38(3), pp.190-194

13th European X-Ray Spectrometry Conference (EXRS 2008) (Cavtat, CROATIA, 16/06/2008 - 20/06/2008)

01/05/2009

DOI: https://doi.org/10.1002/xrs.1142

Abstract

Science & Technology

UNIVERSAL CORRECTION PROCEDURE

ELECTRON-PROBE MICROANALYSIS

FACILITY

Technology

Spectroscopy

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Title: Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study
Creators: MJ Bailey
KJ Kirkby
C Jeynes
Contributors: JOHN WILEY & SONS LTD (null)
Publication Details: X-RAY SPECTROMETRY, Vol.38(3), pp.190-194
Conference: 13th European X-Ray Spectrometry Conference (EXRS 2008) (Cavtat, CROATIA, 16/06/2008 - 20/06/2008)
Date published: 01/05/2009
Date submitted: 06/02/2012
Identifiers: 99511134402346
Academic Unit: School of Computer Science and Electronic Engineering; Department of Chemistry
Resource Type: Conference presentation

Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study

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