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More about the extraction of emission area from Fowler-Nordheim plots
Conference presentation

More about the extraction of emission area from Fowler-Nordheim plots

TECHNICAL DIGEST OF THE 16TH INTERNATIONAL VACUUM MICROELECTRONICS CONFERENCE, pp.89-89
16th International Vacuum Microelectronics Conference (IVMC2003) (TOKYO, JAPAN, 07/07/2003–11/07/2003)
01/01/2003

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Science & Technology Physical Sciences Technology Chemistry Applied Engineering Electrical & Electronic Materials Science Multidisciplinary Physics Applied Chemistry Engineering Materials Science Physics
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