Pump-probe measurement of lifetime engineering in SiGe quantum wells below the optical phonon energy

Journal article

Peer reviewed

C. R. Pidgeon, P. J. Phillips, D. Carder, B. N. Murdin, T. Fromherz, D. J. Paul, Wei Xin Ni and Ming Zhao

Semiconductor science and technology, Vol.20(10), pp.L50-L52

01/10/2005

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Title: Pump-probe measurement of lifetime engineering in SiGe quantum wells below the optical phonon energy
Creators: C. R. Pidgeon - Heriot-Watt University
P. J. Phillips - Heriot-Watt University
D. Carder - Heriot-Watt University
B. N. Murdin - University of Surrey
T. Fromherz - Johannes Kepler University of Linz
D. J. Paul - University of Cambridge
Wei Xin Ni - University of Linkoeping, Sweden
Ming Zhao - University of Linkoeping, Sweden
Publication Details: Semiconductor science and technology, Vol.20(10), pp.L50-L52
Publication Date: 01/10/2005
Identifiers: 991142231002346; WOS:000232992800002
Academic Unit: School of Maths and Physics
Language: English
Resource Type: Journal article