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Sequential application of Time of Flight-Secondary Ion Mass Spectrometry after vacuum metal deposition on glass, polyethylene terephthalate and polyvinyl chloride
Journal article   Peer reviewed

Sequential application of Time of Flight-Secondary Ion Mass Spectrometry after vacuum metal deposition on glass, polyethylene terephthalate and polyvinyl chloride

Deborah Charlton, Aaron Dove, Steve Hinder, Catia Costa, Andreas Ruediger, John F. Watts and Melanie J. Bailey
Science & justice, 101351

Abstract

Fingermark visualization manual Fingerprints Time of Flight-Secondary Ion Mass Spectrometry ToF-SIMS Vacuum metal deposition VMD
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https://doi.org/10.1016/j.scijus.2025.101351View
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