Abstract
We studied InSb quantum well devices using Landau level tunneling spectroscopy through a three-terminal differential conductance technique. This method is similar to filled state scanning tunneling microscopy but uses a stationary contact instead of a mobile tip to analyze the two-dimensional electron system. Applying magnetic fields up to 15 T, we identified clear peaks in the differential current-voltage profiles, indicative of Landau level formation. By examining deviations from the expected Landau fan diagram, we extract an absolute value for the exchange-induced energy shift. Through an empirical analysis, we derive a formula describing the exchange shift as a function of both magnetic field strength and electron filling. Our findings indicate that the emptying of the í µí¼ˆ = 2 and í µí¼ˆ = 3 Landau levels causes an exchange interaction energy shift in the í µí¼ˆ = 1 level. Unlike prior studies that infer level energies relative to one another and report oscillatory g-factor behavior, our method references the energy of the Landau levels above the filled states of the contact under a bias voltage, revealing that only the ground state Landau level experiences a measurable exchange shift.