X-ray photoelectron spectroscopy studies of Ti-Al and Ti-Al-V alloys using CrK beta radiation

S Diplas; JF Watts; P Tsakiropoulos; G Shao; G Beamson; JAD Matthew

doi:10.1002/sia.1103.abs

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X-ray photoelectron spectroscopy studies of Ti-Al and Ti-Al-V alloys using CrK beta radiation

Journal article

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X-ray photoelectron spectroscopy studies of Ti-Al and Ti-Al-V alloys using CrK beta radiation

S Diplas, JF Watts, P Tsakiropoulos, G Shao, G Beamson and JAD Matthew

SURFACE AND INTERFACE ANALYSIS, Vol.31(8), pp.734-744

01/08/2001

DOI: https://doi.org/10.1002/sia.1103.abs

Abstract

Science & Technology

Physical Sciences

Chemistry

Physical

Chemistry

CHEMISTRY

PHYSICAL

XPS

Ti-Al

Ti-Al-V

Auger parameter

CrK beta

AUGER-PARAMETER

CHARGE-TRANSFER

ELECTRONIC-STRUCTURE

PHASE

STATES

ALKALI

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Title: X-ray photoelectron spectroscopy studies of Ti-Al and Ti-Al-V alloys using CrK beta radiation
Creators: S Diplas
JF Watts
P Tsakiropoulos
G Shao
G Beamson
JAD Matthew
Publication Details: SURFACE AND INTERFACE ANALYSIS, Vol.31(8), pp.734-744
Publisher: JOHN WILEY & SONS LTD
Date published: 01/08/2001
Date submitted: 17/05/2017
Identifiers: 99512613802346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

X-ray photoelectron spectroscopy studies of Ti-Al and Ti-Al-V alloys using CrK beta radiation

Abstract

Files and links (1)

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