Use of ellipsometry and gravimetry to develop calibration standards for measuring silicone coat weight and thickness with x-ray fluorescence spectroscopy

B Parbhoo; S Izrael; JM Salamanca; JL Keddie

doi:10.1002/(SICI)1096-9918(200005)29:5<341::AID-SIA874>3.0.CO;2-I

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Use of ellipsometry and gravimetry to develop calibration standards for measuring silicone coat weight and thickness with x-ray fluorescence spectroscopy

Journal article

Peer reviewed

Use of ellipsometry and gravimetry to develop calibration standards for measuring silicone coat weight and thickness with x-ray fluorescence spectroscopy

B Parbhoo, S Izrael, JM Salamanca and JL Keddie

SURFACE AND INTERFACE ANALYSIS, Vol.29(5), pp.341-345

01/05/2000

DOI: https://doi.org/10.1002/(SICI)1096-9918(200005)29:5<341::AID-SIA874>3.0.CO;2-I

Abstract

Science & Technology

Physical Sciences

Chemistry

Physical

Chemistry

CHEMISTRY

PHYSICAL

silicone

coatings

ellipsometry

thickness

x-ray fluorescence spectroscopy

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Title: Use of ellipsometry and gravimetry to develop calibration standards for measuring silicone coat weight and thickness with x-ray fluorescence spectroscopy
Creators: B Parbhoo
S Izrael
JM Salamanca
JL Keddie
Publication Details: SURFACE AND INTERFACE ANALYSIS, Vol.29(5), pp.341-345
Publisher: JOHN WILEY & SONS LTD
Date published: 01/05/2000
Date submitted: 17/05/2017
Identifiers: 99511303402346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Use of ellipsometry and gravimetry to develop calibration standards for measuring silicone coat weight and thickness with x-ray fluorescence spectroscopy

Abstract

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Details

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