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Total internal reflection optical switch in SOI with defect engineered barrier region
Journal article   Open access  Peer reviewed

Total internal reflection optical switch in SOI with defect engineered barrier region

D Thomson, G Reed, A Knights, P Yang, F Gardes, A Smith and K Litvinenko
Journal of Lightwave Technology, Vol.28(17), pp.2483-2491
28/06/2010

Abstract

Total internal reflection optical switches offer a switching operation which can be wavelength insensitive, thermally stable and polarisation independent. The implementation of such a switch based upon carrier injection in silicon is difficult due to the long diffusion lengths of injected free carriers. In this paper experimental results are presented which show that a reflective type switching operation is obtainable if a barrier formed of defective silicon is used to reduce free carrier diffusion.
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http://dx.doi.org/10.1364/OE.19.011804View
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