ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source

SJ Hinder; C Lowe; JF Watts

doi:10.1002/sia.2546

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ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source

Journal article

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ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source

SJ Hinder, C Lowe and JF Watts

SURFACE AND INTERFACE ANALYSIS, Vol.39(6), pp.467-475

01/06/2007

DOI: https://doi.org/10.1002/sia.2546

Abstract

Science & Technology

Physical Sciences

Chemistry

Physical

Chemistry

CHEMISTRY

PHYSICAL

time-of-flight secondary ion mass spectrometry

depth profiling

C-60

coil coatings

polymer

ION MASS-SPECTROMETRY

HIGH-RESOLUTION XPS

BUCKMINSTERFULLERENE PROBE

ORGANIC MATERIALS

STATIC SIMS

FILMS

BOMBARDMENT

PROJECTILES

BEAM

AG

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Title: ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source
Creators: SJ Hinder
C Lowe
JF Watts
Publication Details: SURFACE AND INTERFACE ANALYSIS, Vol.39(6), pp.467-475
Publisher: JOHN WILEY & SONS LTD
Publication Date: 01/06/2007
Identifiers: 99515439502346; WOS:000246561800001
Academic Unit: School of Mechanical Engineering Sciences
Language: English
Resource Type: Journal article

ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source

Abstract

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