The determination of adsorption isotherms by XPS and ToF-SIMS: their role in adhesion science

JF Watts; JE Castle

doi:10.1016/S0143-7496(98)00068-2

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The determination of adsorption isotherms by XPS and ToF-SIMS: their role in adhesion science

Journal article

Peer reviewed

The determination of adsorption isotherms by XPS and ToF-SIMS: their role in adhesion science

JF Watts and JE Castle

INTERNATIONAL JOURNAL OF ADHESION AND ADHESIVES, Vol.19(6), pp.435-443

01/01/1999

DOI: https://doi.org/10.1016/S0143-7496(98)00068-2

Abstract

Science & Technology

Technology

Engineering

Chemical

Materials Science

Multidisciplinary

Engineering

Materials Science

ENGINEERING

CHEMICAL

MATERIALS SCIENCE

MULTIDISCIPLINARY

ToF-SIMS

X-ray photoelectron spectroscopy

adhesion by chemical bonding

interface

absorption isotherm

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Title: The determination of adsorption isotherms by XPS and ToF-SIMS: their role in adhesion science
Creators: JF Watts
JE Castle
Publication Details: INTERNATIONAL JOURNAL OF ADHESION AND ADHESIVES, Vol.19(6), pp.435-443
Publisher: ELSEVIER SCI LTD
Date published: 01/01/1999
Date submitted: 17/05/2017
Identifiers: 99511086002346
Academic Unit: University of Surrey; Department of Mechanical Engineering Sciences
Language: English
Resource Type: Journal article

The determination of adsorption isotherms by XPS and ToF-SIMS: their role in adhesion science

Abstract

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