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Structural and electrical properties of threading dislocations in GaN
Journal article   Peer reviewed

Structural and electrical properties of threading dislocations in GaN

J Elsner, R Jones, PK Sitch, T Frauenheim, MI Heggie, S Öberg and PR Briddon
Materials Science Forum, Vol.258-26(PART 2), pp.1203-1210
01/12/1997

Abstract

The atomic structures and electrical properties for threading screw and threading edge dislocations of wurtzite GaN are calculated within the local-density approximation. Both dislocations are electrically inactive with a band gap free from deep levels. These results are understood to arise from relaxed core structures which are similar to (1010) surfaces. The threading screw dislocations are found to be stable with an open-core whereas the threading edge dislocations possess filled cores.

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