Abstract
A dedicated scanning transmission electron microscope is ideally coupled with energy dispersive x-ray and electron energy loss spectroscopies to obtain information about the chemical composition, morphology and electronic structure on the nanoscale. With several signals being available simultaneously with the pass of a sub-nanometresized beam, this instrument can answer questions from a broad range of research areas, in a timely fashion. The user-friendliness of the instrument comes at almost no cost in performance, making it an ideal multi-tool in a teaching environment.