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Quantitative electrostatic force microscopy-phase measurements
Journal article   Peer reviewed

Quantitative electrostatic force microscopy-phase measurements

CH Lei, A Das, M Elliott and JE Macdonald
NANOTECHNOLOGY, Vol.15(5), pp.627-634
01/05/2004
DOI: https://doi.org/10.1088/0957-4484/15/5/038

Abstract

Science & Technology Technology Physical Sciences Nanoscience & Nanotechnology Materials Science Multidisciplinary Physics Applied Science & Technology - Other Topics Materials Science Physics MATERIALS SCIENCE MULTIDISCIPLINARY NANOSCIENCE & NANOTECHNOLOGY PHYSICS APPLIED KELVIN PROBE MICROSCOPY CONTACT POTENTIAL DIFFERENCE FIELD-EFFECT TRANSISTORS RESOLUTION SURFACE CONDUCTIVITY TRANSPORT CHARGE DNA
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