Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES

AC Simonsen; JP Pohler; C Jeynes; S Tougaard

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Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES

Journal article

Peer reviewed

Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES

AC Simonsen, JP Pohler, C Jeynes and S Tougaard

SURFACE AND INTERFACE ANALYSIS, Vol.27(1), pp.52-56

01/01/1999

Abstract

Science & Technology

Physical Sciences

Chemistry

Physical

Chemistry

CHEMISTRY

PHYSICAL

quantitative XPS

RBS

thin films

inelastic peak shape analysis

RAY PHOTOELECTRON-SPECTROSCOPY

QUANTITATIVE-ANALYSIS

NANOSTRUCTURE

GROWTH

FILMS

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Title: Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES
Creators: AC Simonsen
JP Pohler
C Jeynes
S Tougaard
Publication Details: SURFACE AND INTERFACE ANALYSIS, Vol.27(1), pp.52-56
Publisher: JOHN WILEY & SONS LTD
Date published: 01/01/1999
Date submitted: 17/05/2017
Identifiers: 99515870302346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES

Abstract

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