Abstract
This article proposes that we should think differently about predicting and interpreting measured field electron emission (FE) current-voltage [I_m(V_m)] characteristics. It is commonly assumed that I_m(V_m) data interpretation is a problem in emission physics and related electrostatics. Many experimentalists then apply the Fowler-Nordheim plot methodology, developed in 1929. However, with modern emitting materials, this 90-year-old interpretation methodology often fails (maybe in nearly 50% of cases) and yields spurious values for characterization parameters, particularly field enhancement factors. This has generated an unreliable literature. Hence, validity checks on experimental I_m(V_m) data are nearly always needed before use. A new check, supplementing existing checks, is described. Twelve different "system complications" that, acting singly or in combinations, can cause validity-check failure are identified. A top-level path forward from this unsatisfactory situation is proposed. The term "field electron emission system (FE system) " is defined to include all aspects of an experimental system that affect the measured I_m(V_m) characteristics. The analysis of FE systems should now be regarded as a specialized form of electronic/electrical engineering, provisionally called "FE Systems Engineering. " In this approach, the I_m(V_m) relationship is split as follows: (a) the current is expressed as a function I_m(F_C) of the local surface-field magnitude F_C at some defined emitter surface location "C", and (b) the relationship between F_C and measured voltage V_m is expressed and determined separately. Determining I_m(F_C) is mostly a problem in emission physics. Determining the relationship F_C(V_m) depends on system electrostatics and (for systems failing a validity check) on the other aspects of FE Systems Engineering, in particular, electrical-circuit modeling. The scope of FE Systems Engineering and some related research implications and problems are outlined.