Abstract
We propagate for the first time correlated measurement uncertainties into a nonlinear behavioral model of a millimeter-wave amplifier. We make use of the National Institute of Standards and Technology Microwave Uncertainty Framework to evaluate the uncertainties in large-signal electromagnetic wave measurements of an amplifier, followed by the extraction of Xparameters using an industry standard algorithm. This extracted model is included as a component in a circuit simulator to evaluate gain and efficiency incorporating measurement uncertainty.