Surrey researchers Sign in
Outage Probability Analysis of RIS-Assisted Wireless Networks With Von Mises Phase Errors
Journal article   Peer reviewed

Outage Probability Analysis of RIS-Assisted Wireless Networks With Von Mises Phase Errors

Tianxiong Wang, Mihai-Alin Badiu, Gaojie Chen and Justin P. Coon
IEEE wireless communications letters, Vol.10(12), pp.2737-2741
01/12/2021

Abstract

Gamma distribution line-of-sight (LoS) outage probability Power system reliability Probability Probability density function Reconfigurable intelligent surface (RIS) Signal to noise ratio Taylor series Von Mises distribution Wireless networks

Metrics

Details

Usage Policy