Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip

K Hoshino; LJ Rozanski; DAV Bout; X Zhang

doi:10.1063/1.2904698

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Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip

Journal article

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Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip

K Hoshino, LJ Rozanski, DAV Bout and X Zhang

APPLIED PHYSICS LETTERS, Vol.92(13), pp.?-?

31/03/2008

DOI: https://doi.org/10.1063/1.2904698

Abstract

Science & Technology

Physical Sciences

Physics

Applied

Physics

PHYSICS

APPLIED

FOCUSED ION-BEAM

ELECTRICAL-PROPERTIES

N JUNCTIONS

ELECTROLUMINESCENCE

FABRICATION

APERTURE

IMPLANTATION

NSOM

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Title: Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip
Creators: K Hoshino
LJ Rozanski
DAV Bout
X Zhang
Publication Details: APPLIED PHYSICS LETTERS, Vol.92(13), pp.?-?
Publisher: AMER INST PHYSICS
Date published: 31/03/2008
Date submitted: 17/11/2011
Identifiers: 99512594702346
Academic Unit: School of Computer Science and Electronic Engineering
Language: English
Resource Type: Journal article

Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip

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