Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

SS Roy; R McCann; P Papakonstantinou; JA McLaughlin; IW Kirkman; S Bhattacharyya; SRP Silva

doi:10.1063/1.2173046

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Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

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Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

SS Roy, R McCann, P Papakonstantinou, JA McLaughlin, IW Kirkman, S Bhattacharyya and SRP Silva

JOURNAL OF APPLIED PHYSICS, Vol.99(4), pp.?-?

15/02/2006

DOI: https://doi.org/10.1063/1.2173046

Abstract

Science & Technology

Physical Sciences

Physics

Applied

Physics

PHYSICS

APPLIED

TETRAHEDRAL AMORPHOUS-CARBON

THIN-FILMS

BONDING MODIFICATIONS

DEFECT DENSITY

NITRIDE

RAMAN

SPECTROSCOPY

REDUCTION

EMISSION

SPECTRA

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Title: Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films
Creators: SS Roy
R McCann
P Papakonstantinou
JA McLaughlin
IW Kirkman
S Bhattacharyya
SRP Silva
Publication Details: JOURNAL OF APPLIED PHYSICS, Vol.99(4), pp.?-?
Publisher: AMER INST PHYSICS
Date published: 15/02/2006
Date submitted: 27/05/2010
Identifiers: 99511811002346
Academic Unit: School of Computer Science and Electronic Engineering
Language: English
Resource Type: Journal article

Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

Abstract

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