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Modeling of thermal effects in semiconductor structures
Journal article   Peer reviewed

Modeling of thermal effects in semiconductor structures

CM Snowden
VLSI Design, Vol.8(1-4), pp.53-58
01/12/1998

Abstract

A fully coupled electro-thermal hydrodynamic model is described which is suitable for modelling active devices. The model is applied to the non-isothermal simulation of pseudomorphic high electron mobility transistors (pHEMTs). A large-scale surface temperature model is described which allows thermal modelling of semiconductor devices and monolithic circuits. An example of the application of thermal modelling to monolithic circuit characterization is given.

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