Measurement of heterojunction bipolar transistor thermal resistance based on a pulsed I-V system

PM McIntosh; CM Snowden

doi:10.1049/el:19970059

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Measurement of heterojunction bipolar transistor thermal resistance based on a pulsed I-V system

Journal article

Peer reviewed

Measurement of heterojunction bipolar transistor thermal resistance based on a pulsed I-V system

PM McIntosh and CM Snowden

ELECTRONICS LETTERS, Vol.33(1), pp.100-101

02/01/1997

DOI: https://doi.org/10.1049/el:19970059

Abstract

Science & Technology

Technology

Engineering

Electrical & Electronic

Engineering

ENGINEERING

ELECTRICAL & ELECTRONIC

power bipolar transistors

heterojunction bipolar transistors

power transistors

heat transfer

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Title: Measurement of heterojunction bipolar transistor thermal resistance based on a pulsed I-V system
Creators: PM McIntosh
CM Snowden
Publication Details: ELECTRONICS LETTERS, Vol.33(1), pp.100-101
Publisher: IEE-INST ELEC ENG
Date published: 02/01/1997
Date submitted: 16/05/2017
Identifiers: 99511739002346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Measurement of heterojunction bipolar transistor thermal resistance based on a pulsed I-V system

Abstract

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