Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam

L Hao; JC Macfarlane; JC Gallop; D Cox; J Beyer; D Drung; T Schurig

doi:10.1063/1.2917580

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Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam

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Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam

L Hao, JC Macfarlane, JC Gallop, D Cox, J Beyer, D Drung and T Schurig

APPLIED PHYSICS LETTERS, Vol.92(19), pp.?-?

12/05/2008

DOI: https://doi.org/10.1063/1.2917580

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Science & Technology

Physical Sciences

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APPLIED

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Title: Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam
Creators: L Hao
JC Macfarlane
JC Gallop
D Cox
J Beyer
D Drung
T Schurig
Publication Details: APPLIED PHYSICS LETTERS, Vol.92(19), pp.?-?
Publisher: AMER INST PHYSICS
Date published: 12/05/2008
Date submitted: 19/10/2012
Identifiers: 99516758902346
Academic Unit: School of Computer Science and Electronic Engineering
Language: English
Resource Type: Journal article

Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam

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