Abstract
Pulsed-laser (248 nm) irradiation of Ag thin films was employed to produce nanostructured AgSi O2 substrates. By tailoring the laser fluence, it was possible to controllably adjust the mean diameter of the resultant near-spherical Ag droplets. Thin films of tetrahedral amorphous carbon (ta-C) were subsequently deposited onto the nanostructured substrates. Visible Raman measurements were performed on the ta-C films, where it was observed that the intensity of the Raman signal was increased by nearly two orders of magnitude, when compared with ta-C films grown on nonstructured substrates. The use of laser annealing as a method of preparing substrates, at low macroscopic temperatures, for surface-enhanced Raman spectroscopy on subnanometer-thick films is discussed. © 2006 American Institute of Physics.