Investigation of the thermal charge "trapping-detrapping" in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra

M Ishii; IF Crowe; MP Halsall; AP Knights; RM Gwilliam; B Hamilton

doi:10.1063/1.4772475

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Investigation of the thermal charge "trapping-detrapping" in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra

Journal article

Peer reviewed

Investigation of the thermal charge "trapping-detrapping" in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra

M Ishii, IF Crowe, MP Halsall, AP Knights, RM Gwilliam and B Hamilton

APPLIED PHYSICS LETTERS, Vol.101(24), ARTN 24210

10/12/2012

DOI: https://doi.org/10.1063/1.4772475

Abstract

Science & Technology

Physical Sciences

Physics

Applied

Physics

PHYSICS

APPLIED

SI NANOCRYSTALS

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Title: Investigation of the thermal charge "trapping-detrapping" in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra
Creators: M Ishii
IF Crowe
MP Halsall
AP Knights
RM Gwilliam
B Hamilton
Publication Details: APPLIED PHYSICS LETTERS, Vol.101(24), ARTN 24210
Publisher: AMER INST PHYSICS
Date published: 10/12/2012
Date submitted: 17/05/2017
Identifiers: 99513112502346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Investigation of the thermal charge "trapping-detrapping" in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra

Abstract

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