Investigation of the internal electric field distribution under in situ x-ray irradiation and under low temperature conditions by the means of the Pockels effect

G Prekas; PJ Sellin; P Veeramani; AW Davies; A Lohstroh; ME Ozsan; MC Veale

doi:10.1088/0022-3727/43/8/085102

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Investigation of the internal electric field distribution under in situ x-ray irradiation and under low temperature conditions by the means of the Pockels effect

G Prekas, PJ Sellin, P Veeramani, AW Davies, A Lohstroh, ME Ozsan and MC Veale

JOURNAL OF PHYSICS D-APPLIED PHYSICS, Vol.43(8), pp.?-?

03/03/2010

DOI: https://doi.org/10.1088/0022-3727/43/8/085102

Abstract

Science & Technology

Physical Sciences

Physics

Applied

Physics

CADMIUM ZINC TELLURIDE

TRANSPORT-PROPERTIES

RADIATION DETECTORS

CDTE

CHARGE

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Title: Investigation of the internal electric field distribution under in situ x-ray irradiation and under low temperature conditions by the means of the Pockels effect
Creators: G Prekas
PJ Sellin
P Veeramani
AW Davies
A Lohstroh
ME Ozsan
MC Veale
Publication Details: JOURNAL OF PHYSICS D-APPLIED PHYSICS, Vol.43(8), pp.?-?
Publisher: IOP PUBLISHING LTD
Date published: 03/03/2010
Date submitted: 03/01/2012
Identifiers: 99516316902346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Investigation of the internal electric field distribution under in situ x-ray irradiation and under low temperature conditions by the means of the Pockels effect

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