- Title
- Imaging Excited-State Dynamics in Two-Dimensional Semiconductors with Emerging Ultrafast Measurement Techniques
- Creators
- Joshua Reding - University of Surrey, School of Maths and PhysicsWei Zhang - University of Surrey, School of Computer Science and Electronic EngineeringJeremy Allam - University of Surrey, School of Maths and Physics
- Publication Details
- Accounts of Materials Research, Vol.2(2), pp.75-85
- Date published
- 26/02/2021
- Identifiers
- 99544123402346
- Copyright
- © 2021 Accounts of Materials Research. Co-published by ShanghaiTech University and American Chemical Society. All rights reserved.
- Academic Unit
- School of Maths and Physics
- Language
- English
- Resource Type
- Journal article
Journal article
Imaging Excited-State Dynamics in Two-Dimensional Semiconductors with Emerging Ultrafast Measurement Techniques
Accounts of Materials Research, Vol.2(2), pp.75-85
26/02/2021
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