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How fast do Chinese firms learn and catch up? Evidence from patent citations
Journal article   Open access  Peer reviewed

How fast do Chinese firms learn and catch up? Evidence from patent citations

YUANDI YUANDI WANG, Nadine ROIJAKKERS and Wim VANHAVERBEKE
Scientometrics, Vol.98(1), pp.743-761
01/2014

Abstract

Information science. Documentation Library and information science. General aspects Bibliometrics. Scientometrics. Evaluation Bibliometrics. Scientometrics Exact sciences and technology Information and communication sciences Sciences and techniques of general use
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https://link.springer.com/article/10.1007/s11192-013-1016-6View
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