High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms

NP Barradas; AP Knights; C Jeynes; OA Mironov; TJ Grasby; EHC Parker

doi:10.1103/PhysRevB.59.5097

Back

Journal article

High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms

NP Barradas, AP Knights, C Jeynes, OA Mironov, TJ Grasby and EHC Parker

PHYSICAL REVIEW B, Vol.59(7), pp.5097-5105

15/02/1999

DOI: https://doi.org/10.1103/PhysRevB.59.5097

Abstract

Science & Technology

Physical Sciences

Physics

Condensed Matter

Physics

PHYSICS

CONDENSED MATTER

IBA METHODS

RBS

Files and links (1)

url

http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000078778800089&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=11d2a86992e85fb529977dad66a846d5View

Author

Metrics

21 Record Views

30 Times Cited - Web of Science

Details

Title: High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms
Creators: NP Barradas
AP Knights
C Jeynes
OA Mironov
TJ Grasby
EHC Parker
Publication Details: PHYSICAL REVIEW B, Vol.59(7), pp.5097-5105
Publisher: AMER PHYSICAL SOC
Date published: 15/02/1999
Date submitted: 17/05/2017
Identifiers: 99515779902346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms

Abstract

Files and links (1)

Metrics

Details

Usage Policy