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Generalizing DET Curves Across Application Scenarios
Journal article   Open access  Peer reviewed

Generalizing DET Curves Across Application Scenarios

N Poh and CH Chan
IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, Vol.10(10), pp.2171-2181
01/10/2015

Abstract

Science & Technology Technology Computer Science Theory & Methods Engineering Electrical & Electronic Computer Science Engineering Biometrics perform evaluation/prediction bootstrap subset PERFORMANCE Computer Science
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