Far-infrared picosecond time-resolved measurement of the free-induction decay in GaAs:Si

Journal article

P. C.M. Planken, P. C. Van Son, J. N. Hovenier, T. O. Klaassen, W. Th Wenckebach, B. N. Murdin and G. M.H. Knippels

Physical review. B, Condensed matter, Vol.51(15), pp.9643-9647

15/04/1995

PMID: 9977628

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Title: Far-infrared picosecond time-resolved measurement of the free-induction decay in GaAs:Si
Creators: P. C.M. Planken - Delft University of Technology
P. C. Van Son - Delft University of Technology
J. N. Hovenier - Delft University of Technology
T. O. Klaassen - Delft University of Technology
W. Th Wenckebach - Delft University of Technology
B. N. Murdin - Institute for Atomic and Molecular Physics
G. M.H. Knippels - Institute for Atomic and Molecular Physics
Publication Details: Physical review. B, Condensed matter, Vol.51(15), pp.9643-9647
Number of pages: 5
Publication Date: 15/04/1995
Identifiers: 991142230102346; WOS:A1995QV23700024
Academic Unit: School of Maths and Physics
Language: English
Resource Type: Journal article