Electron spectroscopy with CrK beta photons: high energy XPS and X-AES

S Diplas; JF Watts; SA Morton; G Beamson; P Tsakiropoulos; DT Clark; JE Castle

doi:10.1016/S0368-2048(00)00290-5

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Electron spectroscopy with CrK beta photons: high energy XPS and X-AES

Journal article

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Electron spectroscopy with CrK beta photons: high energy XPS and X-AES

S Diplas, JF Watts, SA Morton, G Beamson, P Tsakiropoulos, DT Clark and JE Castle

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, Vol.113(2-3), pp.153-166

01/02/2001

DOI: https://doi.org/10.1016/S0368-2048(00)00290-5

Abstract

Science & Technology

Technology

Spectroscopy

SPECTROSCOPY

high energy XPS

CrK beta

electron attenuation length

Auger parameter

MEAN FREE PATHS

AUGER-PARAMETER

CHARGE-TRANSFER

KINETIC-ENERGY

CROSS-SECTIONS

METAL-ALLOYS

SENSITIVITY

RESOLUTION

RADIATION

FILMS

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Title: Electron spectroscopy with CrK beta photons: high energy XPS and X-AES
Creators: S Diplas
JF Watts
SA Morton
G Beamson
P Tsakiropoulos
DT Clark
JE Castle
Publication Details: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, Vol.113(2-3), pp.153-166
Publisher: ELSEVIER SCIENCE BV
Date published: 01/02/2001
Date submitted: 17/05/2017
Identifiers: 99511897802346
Academic Unit: University of Surrey; Department of Mechanical Engineering Sciences
Language: English
Resource Type: Journal article

Electron spectroscopy with CrK beta photons: high energy XPS and X-AES

Abstract

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