Electron beam quality control using an amorphous silicon EPID

JA Beck; GJ Budgell; DA Roberts; PM Evans

doi:10.1118/1.3110671

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Electron beam quality control using an amorphous silicon EPID

Journal article

Open access

Peer reviewed

Electron beam quality control using an amorphous silicon EPID

JA Beck, GJ Budgell, DA Roberts and PM Evans

MEDICAL PHYSICS, Vol.36(5), pp.1859-1866

05/2009

DOI: https://doi.org/10.1118/1.3110671

Abstract

amorphous semiconductors

biomedical equipment

biomedical imaging

electron beams

linear accelerators

quality control

radiation therapy

silicon radiation detectors

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Title: Electron beam quality control using an amorphous silicon EPID
Creators: JA Beck
GJ Budgell
DA Roberts
PM Evans
Publication Details: MEDICAL PHYSICS, Vol.36(5), pp.1859-1866
Publisher: American Association of Physicists in Medicine
Date published: 05/2009
Date submitted: 15/11/2012
Identifiers: 99515739802346
Academic Unit: School of Computer Science and Electronic Engineering
Resource Type: Journal article

Electron beam quality control using an amorphous silicon EPID

Abstract

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