Abstract
Charge carrier lifetime is a key property of semiconductor materials for photonic applications. One of the most established methods for measuring lifetimes is time-resolved photoluminescence (TRPL), which is typically performed as a single-point measurement. In this paper, we demonstrate a new time-correlated single photon counting method (TCSPC) for TRPL microscopy, for which spatial information can be achieved without requiring point-by-point scanning through the use of a compressed sensing (CS) approach. This enables image acquisition with a single pixel detector for mapping the lifetime of semiconductors with high repeatability. The methodology for signal acquisition and image reconstruction was developed and tested through simulations. Effects of noise levels on the reliability and quality of image reconstruction were investigated. Finally, the method was implemented experimentally to demonstrate a proof-of-concept CS TCSPC imaging system for acquiring TRPL maps of semiconductor materials and devices. TRPL imaging results of a semiconductor device acquired using a CS approach are presented and compared with results of TRPL mapping of the same excitation area measured through a point-by-point method. The feasibility of the methodology is demonstrated, the benefits and challenges of the experimental prototype system are presented and discussed.