Cloning localization approach using k-means clustering and support vector machine

AS Alfraih; JA Briffa; S Wesemeyer

doi:10.1117/1.JEI.24.4.043019

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Cloning localization approach using k-means clustering and support vector machine

Journal article

Peer reviewed

Cloning localization approach using k-means clustering and support vector machine

AS Alfraih, JA Briffa and S Wesemeyer

JOURNAL OF ELECTRONIC IMAGING, Vol.24(4), ARTN 04301

01/07/2015

DOI: https://doi.org/10.1117/1.JEI.24.4.043019

Abstract

Science & Technology

Technology

Physical Sciences

Engineering

Electrical & Electronic

Optics

Imaging Science & Photographic Technology

Engineering

image forensics

tamper detection

maximally stable extremal region

scale-invariant feature transform

speeded up robust feature

k-means clustering

support vector machine

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Title: Cloning localization approach using k-means clustering and support vector machine
Creators: AS Alfraih
JA Briffa
S Wesemeyer
Publication Details: JOURNAL OF ELECTRONIC IMAGING, Vol.24(4), ARTN 04301
Publisher: IS&T & SPIE
Date published: 01/07/2015
Date submitted: 17/05/2017
Identifiers: 99515508102346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Cloning localization approach using k-means clustering and support vector machine

Abstract

Files and links (1)

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