Characterization of thick film poly(triarylamine) semiconductor diodes for direct x-ray detection

A Intaniwet; CA Mills; M Shkunov; H Thiem; JL Keddie; PJ Sellin

doi:10.1063/1.3225909

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Characterization of thick film poly(triarylamine) semiconductor diodes for direct x-ray detection

Journal article

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Characterization of thick film poly(triarylamine) semiconductor diodes for direct x-ray detection

A Intaniwet, CA Mills, M Shkunov, H Thiem, JL Keddie and PJ Sellin

JOURNAL OF APPLIED PHYSICS, Vol.106(6), pp.?-?

15/09/2009

DOI: https://doi.org/10.1063/1.3225909

Abstract

Science & Technology

Physical Sciences

Physics

Applied

Physics

PHYSICS

APPLIED

FIELD-EFFECT TRANSISTORS

CHARGE-LIMITED CURRENTS

LIGHT-EMITTING-DIODES

SPACE-CHARGE

POLYMER

PHOTOCURRENT

ELECTRONICS

INSULATORS

DEVICES

TRAPS

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Title: Characterization of thick film poly(triarylamine) semiconductor diodes for direct x-ray detection
Creators: A Intaniwet
CA Mills
M Shkunov
H Thiem
JL Keddie
PJ Sellin
Publication Details: JOURNAL OF APPLIED PHYSICS, Vol.106(6), pp.?-?
Publisher: AMER INST PHYSICS
Date published: 15/09/2009
Date submitted: 05/07/2012
Identifiers: 99511861402346
Academic Unit: School of Maths and Physics
Language: English
Resource Type: Journal article

Characterization of thick film poly(triarylamine) semiconductor diodes for direct x-ray detection

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