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Characterization of paint layers by simultaneous self-consistent fitting of RBS/PIXE spectra using simulated annealing
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Characterization of paint layers by simultaneous self-consistent fitting of RBS/PIXE spectra using simulated annealing

L Beck, C Jeynes and NP Barradas
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.266(8), pp.1871-1874
01/04/2008

Abstract

Science & Technology Technology Physical Sciences Instruments & Instrumentation Nuclear Science & Technology Physics Atomic Molecular & Chemical Physics Nuclear Physics INSTRUMENTS & INSTRUMENTATION NUCLEAR SCIENCE & TECHNOLOGY PHYSICS ATOMIC MOLECULAR & CHEMICAL PHYSICS NUCLEAR PIXE RBS EBS IBA DataFurnace paint layers pigments ION-BEAM ANALYSIS X-RAY-EMISSION SIMULTANEOUS PIXE ANALYSIS SOFTWARE ART ROUGHNESS OBJECTS
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