Characterization of Ni-B amorphous alloys with x-ray photoelectron and secondary ion mass spectroscopy

S Diplas; J Lehrmann; S Jorgensen; T Valand; JF Watts; J Tafto

doi:10.1002/sia.2033

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Characterization of Ni-B amorphous alloys with x-ray photoelectron and secondary ion mass spectroscopy

Journal article

Peer reviewed

Characterization of Ni-B amorphous alloys with x-ray photoelectron and secondary ion mass spectroscopy

S Diplas, J Lehrmann, S Jorgensen, T Valand, JF Watts and J Tafto

SURFACE AND INTERFACE ANALYSIS, Vol.37(5), pp.459-465

01/05/2005

DOI: https://doi.org/10.1002/sia.2033

Abstract

Science & Technology

Physical Sciences

Chemistry

Physical

Chemistry

CHEMISTRY

PHYSICAL

XPS

SIMS

electrodeposition

Ni alloys

CHARGE-TRANSFER CALCULATIONS

HYDROGEN EVOLUTION REACTION

AUGER PARAMETER

ELECTRONIC-STRUCTURE

PD ALLOYS

CHEMICAL-STATES

TI-AL

BEHAVIOR

SPECTRA

SORPTION

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Title: Characterization of Ni-B amorphous alloys with x-ray photoelectron and secondary ion mass spectroscopy
Creators: S Diplas
J Lehrmann
S Jorgensen
T Valand
JF Watts
J Tafto
Publication Details: SURFACE AND INTERFACE ANALYSIS, Vol.37(5), pp.459-465
Publisher: JOHN WILEY & SONS LTD
Date published: 01/05/2005
Date submitted: 17/05/2017
Identifiers: 99511015702346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Characterization of Ni-B amorphous alloys with x-ray photoelectron and secondary ion mass spectroscopy

Abstract

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