Characterisation by TEM and X-ray diffraction of linearly graded composition InGaAs buffer layers on (001) GaAs

FJ Pacheco; D Araujo; SI Molina; R Garcia; A Sacedon; F Gonzalez-Sanz; E Calleja; P Kidd; MA Lourenco

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$Characterisation by TEM and X-ray diffraction of linearly graded composition InGaAs buffer layers on (001) GaAs$

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Characterisation by TEM and X-ray diffraction of linearly graded composition InGaAs buffer layers on (001) GaAs

FJ Pacheco, D Araujo, SI Molina, R Garcia, A Sacedon, F Gonzalez-Sanz, E Calleja, P Kidd and MA Lourenco

MATERIALS SCIENCE AND TECHNOLOGY, Vol.14(12), pp.1273-1278

01/12/1998

Abstract

Science & Technology

Technology

Materials Science

Multidisciplinary

Metallurgy & Metallurgical Engineering

Materials Science

MATERIALS SCIENCE

MULTIDISCIPLINARY

METALLURGY & METALLURGICAL ENGINEERING

ANOMALOUS STRAIN RELAXATION

PLASTIC RELAXATION

EPITAXIAL LAYERS

THIN-FILMS

GROWTH

SUPERLATTICES

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Title: Characterisation by TEM and X-ray diffraction of linearly graded composition InGaAs buffer layers on (001) GaAs
Creators: FJ Pacheco
D Araujo
SI Molina
R Garcia
A Sacedon
F Gonzalez-Sanz
E Calleja
P Kidd
MA Lourenco
Publication Details: MATERIALS SCIENCE AND TECHNOLOGY, Vol.14(12), pp.1273-1278
Publisher: INST MATERIALS
Date published: 01/12/1998
Date submitted: 17/05/2017
Identifiers: 99514639302346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Characterisation by TEM and X-ray diffraction of linearly graded composition InGaAs buffer layers on (001) GaAs

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